• DocumentCode
    86272
  • Title

    An Analysis of Conductor Surface Roughness Effects on Signal Propagation for Stripline Interconnects

  • Author

    Xichen Guo ; Jackson, David R. ; Koledintseva, Marina Y. ; Hinaga, Scott ; Drewniak, James L. ; Ji Chen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Houston, Houston, TX, USA
  • Volume
    56
  • Issue
    3
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    707
  • Lastpage
    714
  • Abstract
    Conductors with a roughened surface have significant effects on high-speed signal propagation on backplane traces designed for a 10+ Gb/s network. An accurate approach to evaluate these effects, including the signal attenuation and the phase delay, is proposed in this paper. A differential extrapolation roughness measurement technique is first used to extract the dielectric properties of the substrate used for lamination, and then a periodic model is used to calculate an equivalent roughened conductor surface impedance, which is then used to modify the transmission line per-unit-length parameters R and L. The results indicate that the conductor surface roughness increases the conductor loss significantly as well as noticeably increasing the effective dielectric constant. This approach is validated using both a full-wave simulation tool and measurements, and is shown to be able to provide robust results for the attenuation constant within ±0.2 Np/m up to 20 GHz.
  • Keywords
    delays; dielectric properties; electromagnetic wave scattering; interconnections; printed circuits; strip line discontinuities; surface roughness; conductor surface roughness effect; dielectric property extraction; differential extrapolation roughness measurement technique; equivalent roughened conductor surface impedance; high speed signal propagation; phase delay; signal attenuation; stripline interconnect; Conductors; Impedance; Rough surfaces; Stripline; Surface impedance; Surface roughness; Surface waves; Floquet waves; full-wave; periodic structure; roughness measurement; surface roughness;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2013.2294958
  • Filename
    6730684