DocumentCode :
86277
Title :
Nonlinear Conductivity Fluctuations in Fe-Chalcogenide Superconductors
Author :
Barone, C. ; Pagano, Stefano ; Adamo, M. ; Sarnelli, E. ; Bellingeri, E. ; Ferdeghini, C.
Author_Institution :
Dipt. di Fis., Univ. di Salerno, Fisciano, Italy
Volume :
23
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
8600304
Lastpage :
8600304
Abstract :
Electric transport and voltage-noise measurements on FeTe0.5Se0.5 epitaxial thin films are reported. The films were grown by pulsed laser ablation deposition on lanthanum aluminate single crystal substrates, and subsequently patterned by ion beam etching. Several configurations, with different voltage contacts distances and different strip widths, have been measured. At low temperature and current bias, the measured low frequency 1/f noise behaves according to the standard resistance fluctuations model. Conversely, an excess unconventional 1/f noise is observed in the high-temperature region (T >; 70 K). The experimental results indicate the existence of an electric field threshold, above which nonlinear fluctuation processes are activated. The results of noise measurements correlate well with the already reported change in sign of the Hall resistance in the same temperature range. Possible correlation between the hole contribution to the electrical transport and nonlinear noise effects observed is discussed.
Keywords :
1/f noise; Hall effect; electric noise measurement; electrical conductivity; etching; fluctuations in superconductors; high-temperature superconductors; ion beam effects; iron compounds; pulsed laser deposition; selenium compounds; superconducting epitaxial layers; tellurium compounds; Fe-chalcogenide superconductors; FeTe0.5Se0.5; Hall resistance; LaAl2O3; current bias; electric field threshold; electric transport measurement; epitaxial thin films; high-temperature region; ion beam etching; low frequency 1/f noise; low temperature bias; nonlinear conductivity fluctuations; nonlinear fluctuation processes; pulsed laser ablation deposition; resistance fluctuation model; single crystal substrates; strip widths; voltage contact; voltage-noise measurements; Current measurement; Films; Noise; Noise measurement; Superconductivity; Temperature measurement; Voltage measurement; Fluctuations; iron-based superconductor; noise; voltage-spectral density;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2232335
Filename :
6375785
Link To Document :
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