DocumentCode :
862820
Title :
Linear stochastic analysis of polluted insulator leakage current
Author :
Amarh, Felix ; Karady, George G. ; Sundararajan, Raji
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Volume :
17
Issue :
4
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
1063
Lastpage :
1069
Abstract :
The measurement and analysis of leakage current (LC) for condition-based monitoring of, and as a means of predicting flashover of polluted insulators has attracted a lot of research. Results presented in the technical literature show that surface arcing of contaminated insulators causes significant variations in the magnitude and shape of the insulator´s leakage current and several techniques have been proposed for analysis. This paper submits the results of applying linear stochastic and statistical (probabilistic) analysis as a signature analysis tool for flashover prediction. A new twist is presented based on statistical analysis of the leakage current envelope (rather than just instantaneous peak values), in particular, level crossings, mean exceedances over high thresholds, and extreme value analysis of the envelope. The analysis was performed offline using digitized samples of leakage current obtained from a data-acquisition (DAQ) system, which continuously scans the leakage current during flashover tests in a laboratory fog chamber.
Keywords :
arcs (electric); data acquisition; electric current measurement; flashover; insulator contamination; leakage currents; probability; statistical analysis; stochastic processes; data-acquisition system; digitized samples; flashover prediction; leakage current analysis; leakage current envelope; leakage current measurement; level crossings; linear stochastic analysis; polluted insulator leakage current; probabilistic analysis; signature analysis; signature analysis tool; statistical analysis; surface arcing; Condition monitoring; Current measurement; Flashover; Insulation; Leakage current; Pollution measurement; Shape; Statistical analysis; Stochastic processes; Surface contamination;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.2002.800878
Filename :
1046885
Link To Document :
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