Title :
Measurements and Improvements of Randomness Deteriorations in the Random Pulser
Author :
Takeuchi, S. ; Yoshimoto, T.
Author_Institution :
Department of Electronic Engineering Saitama University 255 Shimo-Ohkubo, Urawa, Saitama, Japan
Abstract :
The random pulser utilizing the avalanche noise has been studied on its randomness deteriorations.
Keywords :
Diodes; Flip-flops; Nuclear electronics; Printed circuits; Pulse amplifiers; Pulse measurements; Radiation detectors; Switches; Testing; Time measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332279
