• DocumentCode
    863245
  • Title

    Microwave signal-to-noise performance of CdSe bulk photoconductive detectors

  • Author

    DiDomenico, M., Jr. ; Anderson, L.K.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, NJ
  • Volume
    52
  • Issue
    7
  • fYear
    1964
  • fDate
    7/1/1964 12:00:00 AM
  • Firstpage
    815
  • Lastpage
    822
  • Abstract
    The microwave signal and noise response of CdSe bulk photoconductive detectors have been measured and compared with that of a high-speed junction photodiode. The signal measurements were made with CW intensity modulated light at 3000 Mc. Excellent quantitative agreement was obtained between the simple photoconductivity theory of direct light demodulation and experiment. At low optical intensities, the observed noise can be accounted for within the framework of existing theories of generation-recombination (GR) noise when the effects of electron retrapping are accounted for. At high optical intensities, nonlinear deviations are observed which can be accounted for only qualitatively. The results demonstrate clearly that such a photoconductor, when used as a simple quantum counter, will always be thermal rather than GR noise limited. Measurements show that the photoconductor as it is usually used in a nonoptimum configuration is some 50 db less sensitive than a good photodiode.
  • Keywords
    Detectors; Electron optics; High speed optical techniques; Noise generators; Nonlinear optics; Optical modulation; Optical noise; Optical sensors; Photoconductivity; Photodiodes;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.3124
  • Filename
    1445054