Title :
Surface Chemical Treatment Effects in Ultra-High Purity P-Type Si Detectors
Author :
Takami, Y. ; Shiraishi, F. ; Hosoe, M.
Author_Institution :
Institute for Atomic Energy, Rikkyo University, Nagasaka, Yokosuka, Kanagawa, 240-01, Japan
Keywords :
Chemicals; Detectors; Electrodes; Face detection; Gold; Hafnium; Leak detection; Leakage current; Surface treatment; Temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332292
