• DocumentCode
    86333
  • Title

    Monolithic Pixel Sensors for Fast Silicon Vertex Trackers in a Quadruple Well CMOS Technology

  • Author

    Zucca, Stefano ; Gaioni, L. ; Ratti, Lodovico ; Re, V. ; Traversi, Gianluca ; Bettarini, S. ; Forti, F. ; Morsani, Fabio ; Rizzo, Gianluca ; Bosisio, Luciano ; Rashevskaya, Irina

  • Author_Institution
    Dipt. di Ing. Ind. e dell´Inf., Univ. degli Studi di Pavia, Pavia, Italy
  • Volume
    60
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    2343
  • Lastpage
    2351
  • Abstract
    Apsel4well is a monolithic active pixel sensor (MAPS) chip intended for application to fast and low material silicon vertex trackers for future experiments at high intensity machines. The design is based on a 180 nm CMOS process with quadruple well option called INMAPS. This technology makes it possible to increase the in-pixel intelligence as compared to standard three transistor MAPS and their variants. Moreover, the availability of a high resistivity epitaxial layer is confirmed to lead to further improvements in terms of charge collection performance and radiation resistance. This paper, after providing some details on the INMAPS process, focuses on the analog front-end section of the pixel readout chain. Measurement results on the main analog channel parameters, like charge sensitivity and equivalent noise charge, are given along with charge collection properties evaluation through 90Sr/ 90Y spectrum measurements and laser stimulation. Characterization data were also used for validating a TCAD model of the device. Finally, selected results from a neutron irradiation campaign with fluences up to 2.7 × 1013 1 MeV neutron equivalent/cm 2 will be shown.
  • Keywords
    CMOS image sensors; nuclear electronics; readout electronics; silicon radiation detectors; 90Sr/90Y spectrum measurements; Apsel4well chip; CMOS process; INMAPS process; MAPS chip; TCAD model; analog front-end section; charge collection performance; charge sensitivity; equivalent noise charge; fast silicon vertex trackers; high resistivity epitaxial layer; in-pixel intelligence; laser stimulation; main analog channel parameters; monolithic active pixel sensor; neutron irradiation campaign; pixel readout chain; quadruple well CMOS technology; radiation resistance; Capacitance; Charge measurement; Conductivity; Epitaxial layers; Noise; Sensitivity; Standards; CMOS MAPS; low noise design; particle tracking; quadruple well process;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2263428
  • Filename
    6522909