Title :
Novel frame buffer pixel circuits for liquid-crystal-on-silicon microdisplays
Author :
Lee, Sangrok ; Morizio, James C. ; Johnson, Kristina M.
Author_Institution :
Electr. & Comput. Eng. Dept., Duke Univ., Durham, NC, USA
Abstract :
A 32 × 16 liquid-crystal-on-silicon (LCOS) backplane with novel frame buffer pixels is designed and fabricated using the AMI Semiconductor´s 0.5-μm double-poly triple-metal CMOS process. The three novel pixel circuits described herein increase the brightness of an XGA LCOS microdisplay by at least 36% without sacrificing image contrast ratio. The increase of brightness is attributed to maximizing overall image view time, allowing an image to be displayed at full contrast while the next image is buffered onto the backplane. The new circuits achieve this by removing charge sharing and charge inducement problems shown in previously proposed frame buffer pixel circuits. Voltages on the pixel electrodes measured through rail-to-rail operational amplifiers with negative feedback vary from 0 to 4.25 V (6-V power source). All data voltage levels remain constant over a frame time with less than 1% drop, thus ensuring maximum contrast ratio. Modeling and experimental measurement on the fabricated chip show that these pixel circuits outperform all others to date based on storage time, data storage level, and potential for highest contrast ratio with maximum brightness.
Keywords :
CMOS integrated circuits; buffer circuits; feedback; liquid crystal displays; liquid crystal on silicon; microdisplays; 0 to 4.25 V; 0.5-μ hboxm double-poly triple-metal CMOS process; 6-V power source; AMI semiconductor; LCOS backplane; XGA LCOS microdisplay brightness; data storage level; data voltage levels; fabricated chip; frame buffer pixel circuits; frame buffer pixels; full image contrast; image contrast ratio; liquid-crystal-on-silicon microdisplays; maximum brightness; maximum contrast ratio; negative feedback; pixel electrodes; rail-to-rail operational amplifiers; storage time; Ambient intelligence; Backplanes; Brightness; CMOS process; Circuits; Liquid crystal on silicon; Microdisplays; Pixel; Semiconductor device measurement; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2003.820875