Title :
An 8-bit 2-Gsample/s folding-interpolating analog-to-digital converter in SiGe technology
Author :
Vessal, Farhang ; Salama, C. Andre T
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
Abstract :
This paper deals with the design and implementation of an 8-bit 2-Gsample/s folding-interpolating analog-to-digital converter (ADC) using a SiGe technology with a unity gain cutoff frequency fT of 47 GHz. The high-speed high-resolution ADC has applications in direct IF sampling receivers for wideband communication systems. The converter occupies an area of 3.5 mm×3.5 mm including pads and exhibits an effective resolution bandwidth of 700 MHz at a sampling rate of 2 Gsample/s. The maximum DNL and INL are 0.5 and 1 LSB, respectively. The ADC dissipates 3.5W (including output buffers) from a 3.3-V power supply.
Keywords :
Ge-Si alloys; analogue-digital conversion; bipolar integrated circuits; integrated circuit design; 3.3 V; 3.5 W; 3.5 mm; 47 GHz; 700 MHz; 8-bit 2-Gsample/s folding-interpolating ADC; IF sampling receivers; SiGe technology; analog-to-digital converter; differential nonlinearity; high-resolution ADC; high-speed ADC; integral nonlinearity; maximum DNL; maximum INL; output buffers; resolution bandwidth; unity gain cutoff frequency; wideband communication systems; Analog-digital conversion; Bandwidth; Circuits; Digital signal processing; Germanium silicon alloys; Heterojunction bipolar transistors; Paper technology; Sampling methods; Silicon germanium; Switches;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2003.820867
