An 8-bit 2-Gsample/s folding-interpolating analog-to-digital converter in SiGe technology

Author

Vessal, Farhang ; Salama, C. Andre T

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada

Volume

39

Issue

1

fYear

2004

Firstpage

238

Lastpage

241

Abstract

This paper deals with the design and implementation of an 8-bit 2-Gsample/s folding-interpolating analog-to-digital converter (ADC) using a SiGe technology with a unity gain cutoff frequency f_T of 47 GHz. The high-speed high-resolution ADC has applications in direct IF sampling receivers for wideband communication systems. The converter occupies an area of 3.5 mm×3.5 mm including pads and exhibits an effective resolution bandwidth of 700 MHz at a sampling rate of 2 Gsample/s. The maximum DNL and INL are 0.5 and 1 LSB, respectively. The ADC dissipates 3.5W (including output buffers) from a 3.3-V power supply.

Keywords

Ge-Si alloys; analogue-digital conversion; bipolar integrated circuits; integrated circuit design; 3.3 V; 3.5 W; 3.5 mm; 47 GHz; 700 MHz; 8-bit 2-Gsample/s folding-interpolating ADC; IF sampling receivers; SiGe technology; analog-to-digital converter; differential nonlinearity; high-resolution ADC; high-speed ADC; integral nonlinearity; maximum DNL; maximum INL; output buffers; resolution bandwidth; unity gain cutoff frequency; wideband communication systems; Analog-digital conversion; Bandwidth; Circuits; Digital signal processing; Germanium silicon alloys; Heterojunction bipolar transistors; Paper technology; Sampling methods; Silicon germanium; Switches;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.2003.820867

Filename

1261307