DocumentCode :
863718
Title :
Coupling metrics for ontology-based system
Author :
Orme, Anthony M. ; Tao, Hong ; Etzkorn, Letha H.
Author_Institution :
Comput. Sci. Dept., Alabama Univ., Huntsville, AL, USA
Volume :
23
Issue :
2
fYear :
2006
Firstpage :
102
Lastpage :
108
Abstract :
Measuring system coupling is a commonly accepted software engineering practice associated with producing high-quality software products. Coupling metrics traditionally measure data passed across a module interface to determine couplings between modules in a given system. XML has become common in Internet-based application domains such as business-to-business and business-to-consumer applications, and has formed a basis for service-oriented architectures such as Web services and the Semantic Web. We therefore need new coupling metrics that address these systems´ unique requirements. We propose a set of coupling metrics for ontology-based systems represented in OWL: the number of external classes (NEC), reference to external classes (REC), and referenced includes (RI). To collect these metrics, we use a standard XML-based parser. This research reflects a new type of coupling measurement for system development that defines coupling metrics based on ontology data and its structure.
Keywords :
XML; ontologies (artificial intelligence); semantic Web; software metrics; OWL; XML; high-quality software product; ontology-based system; semantic Web; software engineering; software metrics; system development; Application software; OWL; Ontologies; Semantic Web; Service oriented architecture; Software engineering; Software measurement; Web and internet services; Web services; XML; measure; metric; ontology;
fLanguage :
English
Journal_Title :
Software, IEEE
Publisher :
ieee
ISSN :
0740-7459
Type :
jour
DOI :
10.1109/MS.2006.46
Filename :
1605186
Link To Document :
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