Title :
Multifunction, multirange electronic instrument performance prediction
Author :
Koeman, Henriecus
Author_Institution :
John Fluke Manuf. Co. Inc., Everett, WA, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
Critical aspects of practical multifunction, multirange instrument performance predictions are discussed, and a practical implementation to accomplish such predictions is highlighted. It is shown that instruments that can be calibrated using artifact standards simplify the acquisition of data required to perform statistical analysis
Keywords :
calibration; data analysis; measurement standards; multimeters; statistical analysis; artifact standards; data acquisition; data analysis; multifunction instrument; multimeters; multirange electronic instrument; performance prediction; statistical analysis; Calibration; Circuits; Electric resistance; Helium; Instruments; Laboratories; Senior members; Statistical analysis; Uncertainty; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
