DocumentCode :
864074
Title :
A Methodology for Fast VSWR Protection Implemented in a Monolithic 3-W 55% PAE RF CMOS Power Amplifier
Author :
Carrara, Francesco ; Presti, Calogero D. ; Scuderi, Antonino ; Santagati, Carmelo ; Palmisano, Giuseppe
Author_Institution :
Dipt. di Ing. Elettr. Elettron. e dei Sist., Univ. di Catania, Catania
Volume :
43
Issue :
9
fYear :
2008
Firstpage :
2057
Lastpage :
2066
Abstract :
In this paper, the protection of CMOS power amplifiers against load mismatch is addressed. To this purpose, a closed-loop protection circuit is proposed, which is based on a novel current-mode detection and comparison technique. The circuit allows a faster protection lock-in, by enabling peak detection and loop frequency compensation to be performed at the same circuit node, thus reducing the number of low-frequency poles and improving loop bandwidth. The effectiveness of the method is demonstrated through the implementation of a monolithic 0.25-mum 2-V CMOS power amplifier for GSM applications, which can deliver a 3-W output power with 55% overall PAE. The amplifier is able to sustain a 20:1 load VSWR at full power. Excellent RF performance and VSWR ruggedness are hence attained simultaneously, despite a simple common-emitter power stage is used. An experimental reliability assessment allowed the cognizant choice of the maximum drain-gate stress that could be tolerated. Device degradation was characterized by operating a power gain cell at RF, under real-world load and power conditions. Analysis of the degradation data enabled the design of an efficient, yet provably reliable, power amplifier.
Keywords :
CMOS integrated circuits; UHF integrated circuits; UHF power amplifiers; cellular radio; integrated circuit reliability; GSM applications; RF performance; VSWR ruggedness; closed-loop protection circuit; common-emitter power stage; current-mode detection; device degradation; drain-gate stress; fast VSWR protection; load mismatch; loop bandwidth; loop frequency compensation; low-frequency poles; monolithic PAE RF CMOS power amplifier; power 3 W; reliability assessment; size 0.25 mum; voltage 2 V; voltage standing wave ratio; Bandwidth; Circuits; Degradation; Frequency locked loops; GSM; Power amplifiers; Power generation; Protection; Radio frequency; Radiofrequency amplifiers; CMOS analog integrated circuits; CMOS power amplifiers; CMOS radio frequency integrated circuits; CMOS reliability; RF stress; differential amplifiers; high-efficiency amplifiers; mismatch protection; peak detectors; voltage standing-wave ratio (VSWR); wear-out modeling;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.2001894
Filename :
4626005
Link To Document :
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