Title :
Dielectric loss determination using perturbation
Author :
Andrawis, Madeleine Y. ; Davis, William A. ; Riad, Sedki M. ; Elshabini-Riad, A.
Author_Institution :
Dept. of Electr. Eng., South Dakota State Univ., Brookings, SD, USA
Abstract :
A perturbation approach is used to separate the conductor loss from the total measured loss of a dielectric material which fills a nonresonant reflection cavity. The technique is limited to cavities with good conducting walls. Accurate knowledge of the conductor conductivity determines the accuracy of the obtained results. Dielectric loss tangent is estimated over a frequency range typically from 45 MHz to 5 GHz.<>
Keywords :
dielectric loss measurement; microwave reflectometry; perturbation techniques; 45 MHz to 5 GHz; conductor conductivity; conductor loss; dielectric loss measurement; dielectric material; nonresonant reflection cavity; perturbation; Conductivity; Conductors; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency estimation; Loss measurement; Magnetic field measurement; Permittivity; Reflection;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
