Narrowband multifrequency binary measurement using phase shift keyed symbols

Author

Henderson, Ian A. ; McGhee, Joseph ; Muhaisni, Musaed Al

Author_Institution

Dept. of Electron. & Electr. Eng., Strathclyde Univ., Glasgow, UK

Volume

41

Issue

6

fYear

1992

fDate

12/1/1992 12:00:00 AM

Firstpage

775

Lastpage

779

Abstract

Multifrequency binary testing (MBT), which uses multifrequency binary sequence (MBS) test signals, with high signal-to-noise power ratios for their dominant harmonics, to measure frequency response is considered. Information theory, in the form of descriptive languages and codes, digital modulation, and redundancy is used to design novel phase-shift-keyed (PSK) MBS symbols. A signal zooming operation, similar to optical zooming, is used to allow narrowband frequency response measurement with a high spectral resolution

Keywords

frequency measurement; frequency response; harmonic analysis; phase shift keying; signal processing; codes; descriptive languages; digital modulation; frequency response; information theory; multifrequency binary sequence; narrowband frequency response measurement; narrowband multifrequency binary measurement; phase shift keyed symbols; redundancy; signal zooming; signal-to-noise power ratios; Binary sequences; Digital modulation; Frequency measurement; Frequency response; Information theory; Narrowband; Phase measurement; Power measurement; Power system harmonics; Testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.199396

Filename

199396