DocumentCode :
86427
Title :
GaN: A Reliable Future in Power Conversion: Dramatic performance improvements at a lower cost
Author :
Lidow, Alex ; Strydom, Johan ; Strittmatter, Robert ; Chunhua Zhou
Volume :
2
Issue :
1
fYear :
2015
fDate :
Mar-15
Firstpage :
20
Lastpage :
26
Abstract :
For the first time in 60 years, a new, higher-performance technology is less expensive to produce than its silicon counterpart. Gallium nitride (GaN), grown as a thin layer on top of a standard silicon substrate, has demonstrated both a dramatic improvement in transistor performance [1] and the ability to be produced at a lower cost than its aging silicon ancestors. Enhancement-mode GaN transistors have unleashed new applications because of their ability to switch higher voltages and higher currents faster than any transistor before. In this article, we will discuss the status of the technology in terms of device performance, cost, and product reliability.
Keywords :
III-V semiconductors; gallium compounds; semiconductor device reliability; transistors; wide band gap semiconductors; device cost; device performance; enhancement-mode gallium nitride transistors; higher-performance technology; power conversion; product reliability; standard silicon substrate; transistor performance; Gallium nitride; Performance evaluation; Power conversion; Silicon; Substrates; Switching circuits; Transistors;
fLanguage :
English
Journal_Title :
Power Electronics Magazine, IEEE
Publisher :
ieee
ISSN :
2329-9207
Type :
jour
DOI :
10.1109/MPEL.2014.2381457
Filename :
7054053
Link To Document :
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