Investigations and measurements of the dynamic performance of high-speed ADCs

Author

Hagelauer, Richard ; Oehler, Frank ; Rohmer, Guenter ; Sauerer, Josef ; Seitzer, Dieter ; Schmitt, Reinhold ; Winkler, Dieter

Volume

41

Issue

6

fYear

1992

fDate

12/1/1992 12:00:00 AM

Firstpage

829

Lastpage

833

Abstract

The accuracy of ultra-high-speed analog-to-digital converters (ADCs) decreases at higher input frequencies. This is mainly due to timing mismatches, which cause the comparators to sample different time points of the input signal. Investigations concerning the origin of the aperture uncertainty in a 4-b parallel ADC implemented in a 0.5-μm GaAs FET technology were performed. On-chip E-beam measurements of the clock distribution for the comparators showed differences of 20 ps between the comparators. To overcome these problems, a GaAs 5-b 1-Gs/s ADC with on-chip track-and-hold circuitry (T&H) was developed. A complete DC and AC characterization of this 5-b ADC using a histogram test, fast Fourier transform (FFT) test, sinewave curve-fitting test, and beat frequency test up to 1.3 GHz was performed. By using the T&H in front of the parallel ADC, 4.6 effective numbers of bits (ENOBs) are achieved at 1-GHz input signal compared to 3.7 ENOBs without T&H

Keywords

III-V semiconductors; analogue-digital conversion; comparators (circuits); curve fitting; electron beam testing; fast Fourier transforms; field effect integrated circuits; gallium arsenide; integrated circuit testing; microwave measurement; statistical analysis; 1.0 GHz; 1.3 GHz; 20 ps; A/D convertor; AC; DC; E-beam measurements; FET technology; GaAs; beat frequency test; clock distribution; comparators; dynamic performance; fast Fourier transform; flash convertor; histogram test; on-chip track-and-hold circuitry; sinewave curve-fitting test; statistical test; timing mismatches; ultra-high-speed analog-to-digital converters; Analog-digital conversion; Apertures; Circuit testing; Clocks; FETs; Fast Fourier transforms; Frequency conversion; Gallium arsenide; Histograms; Timing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.199417

Filename

199417