Title :
A custom integrated circuit comparator for high-performance sampling applications
Author :
Laug, Owen B. ; Souders, T.M. ; Flach, Donald R.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
The authors report on the design and performance of an application-specific integrated circuit (ASIC) comparator that has been optimized for equivalent-time waveform sampling applications. The comparator, which has been fabricated with an 8.5 GHz fT , bipolar silicon process, features a bandwidth of >2 GHz, a settling-time accuracy of 0.1% in 2 ns, and almost total elimination of `thermal tails´ in the settling response. Several novel design features that have been used to achieve this level of performance are presented. The comparator can be used in a sampling system for both frequency-domain measurements, e.g. wideband RMS voltage measurements, and high-accuracy time-domain pulse measurements
Keywords :
analogue-digital conversion; application specific integrated circuits; bipolar integrated circuits; comparators (circuits); signal processing equipment; voltage measurement; 2 GHz; 8.5 GHz; application-specific integrated circuit; bipolar silicon process; custom integrated circuit comparator; design; equivalent-time waveform sampling; frequency-domain measurements; high-accuracy time-domain pulse measurements; high-performance sampling; performance; settling-time accuracy; thermal tails; wideband RMS voltage measurements; Application specific integrated circuits; Bandwidth; Design optimization; Frequency measurement; Pulse measurements; Sampling methods; Silicon; Tail; Voltage measurement; Wideband;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on