Title :
How to obtain maximum practical performance from state-of-the-art delta-sigma analog-to-digital converters
Author :
LaMay, John L. ; Bogard, Harold T.
Author_Institution :
Crystal Semicond. Corp., Austin, TX, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
A brief review of oversampling delta-sigma converters is provided, along with a description of common noise sources and their propagation methods. This is followed by a discussion of proven techniques that can be used to reduce the amount of noise entering a system
Keywords :
analogue-digital conversion; electron device noise; random noise; capacitive coupling; clock jitter; delta-sigma analog-to-digital converters; direct coupling; inductive coupling; noise sources; oversampling; propagation; random noise; Analog-digital conversion; Circuit noise; Clocks; Delta modulation; Differential amplifiers; Noise reduction; Noise shaping; Semiconductor device noise; Signal to noise ratio; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
