Title :
Near-Field Scanning Optical Tomography: A Nondestructive Method for Three-Dimensional Nanoscale Imaging
Author :
Sun, Jin ; Carney, P. Scott ; Schotland, John C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL
Abstract :
We present the theoretical foundation for near-field scanning optical tomography, a method for three-dimensional optical imaging with subwavelength resolution. An analysis of the forward problem for both scalar and vector optical fields is described. This is followed by the construction of the pseudoinverse solution to the linearized inverse scattering problem. The results are illustrated by numerical simulations
Keywords :
image resolution; inverse problems; nanotechnology; near-field scanning optical microscopy; optical tomography; three-dimensional displays; forward problem; linearized inverse scattering problem; near-field scanning optical tomography; pseudoinverse solution; subwavelength image resolution; three-dimensional nanoscale imaging; Biomedical optical imaging; Inverse problems; Optical imaging; Optical microscopy; Optical scattering; Probes; Spatial resolution; Sun; Tomography; X-ray scattering; Imaging; inverse problems; inverse scattering; microscopy; near-field optics; scanning probe microscopy; tomography;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2006.879567
