Near-Field Scanning Optical Tomography: A Nondestructive Method for Three-Dimensional Nanoscale Imaging

Author

Sun, Jin ; Carney, P. Scott ; Schotland, John C.

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL

Volume

12

Issue

6

fYear

2006

Firstpage

1072

Lastpage

1082

Abstract

We present the theoretical foundation for near-field scanning optical tomography, a method for three-dimensional optical imaging with subwavelength resolution. An analysis of the forward problem for both scalar and vector optical fields is described. This is followed by the construction of the pseudoinverse solution to the linearized inverse scattering problem. The results are illustrated by numerical simulations

Keywords

image resolution; inverse problems; nanotechnology; near-field scanning optical microscopy; optical tomography; three-dimensional displays; forward problem; linearized inverse scattering problem; near-field scanning optical tomography; pseudoinverse solution; subwavelength image resolution; three-dimensional nanoscale imaging; Biomedical optical imaging; Inverse problems; Optical imaging; Optical microscopy; Optical scattering; Probes; Spatial resolution; Sun; Tomography; X-ray scattering; Imaging; inverse problems; inverse scattering; microscopy; near-field optics; scanning probe microscopy; tomography;

fLanguage

English

Journal_Title

Selected Topics in Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

1077-260X

Type

jour

DOI

10.1109/JSTQE.2006.879567

Filename

4032700