DocumentCode :
865243
Title :
90-nm CMOS for microwave power applications
Author :
Ferndahl, M. ; Vickes, H.-O. ; Zirath, Herbert ; Angelov, I. ; Ingvarson, F. ; Litwin, A.
Author_Institution :
Microwave Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
Volume :
13
Issue :
12
fYear :
2003
Firstpage :
523
Lastpage :
525
Abstract :
We report, for the first time, the experimental evaluation of a very short channel 90-nm CMOS transistor under RF over-voltage conditions. At 9 GHz and 1.5 V supply a 40 μm gate width device is able to deliver 370 mW/mm output power with a PAE of 42% and a transducer power gain of 15 dB. Measurement results at 3 and 6 GHz is also presented. The transistor does not show any degradation in either dc or RF performance after prolonged operation at 1 and 6 dB compression. Simulation show, that the peak voltage, V/sub ds/ at this condition is 3.0 V, while the maximum allowed dc supply voltage is limited by the design rules to 1.2 V. We show for the first time that nanometer-scale CMOS can be used for microwave power applications with severe RF over-voltage conditions without any observable degradation.
Keywords :
S-parameters; microwave power amplifiers; microwave power transistors; nanoelectronics; power MOSFET; 1.5 V; 9 GHz; 90 nm; RF overvoltage conditions; microwave power amplifier; microwave power handling capabilities; nanometer-scale CMOS; peak voltage; small signal S-parameter; supply voltage; very short channel CMOS transistor; Bluetooth; CMOS technology; Costs; Degradation; Microwave technology; Microwave transistors; Power generation; Radio frequency; Voltage; Wireless LAN;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2003.819380
Filename :
1261771
Link To Document :
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