DocumentCode :
865324
Title :
Failure of optical fibers with thin hard coatings
Author :
Chakravarthy, Srinath S. ; Chiu, Wilson K.S.
Author_Institution :
Dept. of Mech. Eng., Univ. of Connecticut, Storrs, CT
Volume :
24
Issue :
3
fYear :
2006
fDate :
3/1/2006 12:00:00 AM
Firstpage :
1356
Lastpage :
1363
Abstract :
The strength of optical fibers with a thin brittle coating is examined. The inert strength of optical fibers coated with carbon (hermetic fibers) has been observed to be less than that of standard optical fibers. A fracture mechanics model was developed to explain the mechanism of this strength reduction. The model, based on the cracking of thin films in residual tension, will be used to predict growth of flaws from the carbon film and penetrating into the substrate. The model can be applied to all brittle coatings where delamination of the coating is not observed. Conditions under which cracks in the carbon film propagate into the substrate were investigated using a recently developed superposition scheme. The failure stress of the fiber was predicted using the fracture mechanics model and experimentally measured values of the properties of the film. The predicted values of strength are compared with the measured values of the strength and the difference is less than 10%
Keywords :
brittleness; carbon; cracks; delamination; failure (mechanical); fracture mechanics; mechanical strength; optical fibre cladding; thin films; C; brittle coating; carbon coating; carbon film; coating delamination; failure stress; flaws; fracture mechanics model; hermetic fibers; optical fibers; residual tension; standard optical fibers; strength reduction; substrate; thin brittle coating; thin film cracking; thin hard coatings; Coatings; Delamination; Mechanical factors; Mechanical variables measurement; Optical fibers; Optical films; Predictive models; Stress measurement; Substrates; Transistors; Failure; optical fibers; protective coatings;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2005.863259
Filename :
1605338
Link To Document :
بازگشت