• DocumentCode
    865419
  • Title

    Dynamic HVEM Observations of Metals and Alloys during in-Situ Helium Ion Irradiations

  • Author

    Jesser, W.A.

  • Author_Institution
    Department of Materials Science Thornton Hall, University of Virginia Charlottesville, Virginia 22901
  • Volume
    30
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    1259
  • Lastpage
    1262
  • Abstract
    A 200 kV ion accelerator, with a PIG source for accelerating ionized gases, was coupled to a 500 kV transmission electron microscope in order to investigate the effects of helium irradiation on the development of microstructure in candidate fusion reactor first wall material. The microstructural evolution in nickel and in type 316 stainless steel bombarded by 80 keV helium ions was monitored via video recordings. The effect of specimen thickness and temperature and the effect of plastic deformation during irradiation was considered. In order to conduct these experiments a quantitative load-elongation hot tensile stage was constructed with a capability for monitoring specimen current continuously during the experiment. It was found that surface exfoliation and blistering may occur in specimens thinner than the mean projected range of helium ions. However, in the thinnest specimen regions, surface layer removal is replaced by the bending of individual grains. Blistering apparently can occur when underpressurization of bubbles exists. Plastic deformation during helium ion irradiation can lead to denuded layers adjacent to some grain boundaries and can produce removed surface layers whose thickness is several times greater than the project mean range of the incident helium ions.
  • Keywords
    Acceleration; Couplings; Fusion reactors; Gases; Helium; Ion accelerators; Microstructure; Monitoring; Plastics; Transmission electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4332504
  • Filename
    4332504