Title :
Trace Element Measurements with Synchrotron Radiation
Author :
Hanson, A.L. ; Kraner, H.W. ; Jones, K.W. ; Gordon, B.M. ; Mills, R.E. ; Chen, J.R.
Author_Institution :
Brookhaven National Laboratory Upton, New York 11973 U.S.A.
fDate :
4/1/1983 12:00:00 AM
Abstract :
Aspects of the application of synchrotron radiation to trace element determinations by x-ray fluorescence have been investigated using beams from the Cornell facility, CHESS. Fluoresced x rays were deteted with a Si(Li) detector placed 4 cm from the target at 90° to the beam. Thick samples of NBS Standard Reference Materials were used to calibrate trace element sensitivity and estimate minimum detectable limits for this method.
Keywords :
Brightness; Chemical elements; Electromagnetic wave absorption; Electrons; Fluorescence; Polarization; Spatial resolution; Synchrotron radiation; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332526
