• DocumentCode
    865828
  • Title

    MIG mini composite head using single crystal Mn-Zn ferrite

  • Author

    Iwata, H. ; Noguchi, K. ; Suwabe, S. ; Nishiyama, T.

  • Author_Institution
    Hitachi Metals Ltd., Saitama, Japan
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    2394
  • Lastpage
    2396
  • Abstract
    Metal-in-gap (MIG) miniature composite heads whose magnetic circuit is composed of single-crystal Mn-Zn ferrite and sputtered Fe-Al-Si film were prepared. Recording and readback characteristics are compared with those of MIG heads using polycrystalline Mn-Zn ferrite. The relationship between timing asymmetry and bit shift is discussed. Results of magnetic-domain observation by SPIN SEM (scanning electron microscopy) are presented. The output voltage of the single-crystal ferrite MIG head showed a 35% higher value than that of ordinary polycrystalline ferrite. This result is due to the higher readback efficiency, arising from higher permeability of the stressed ferrite. Bit shifts of single-crystal MIG heads are small because of their small timing asymmetry and sharp distribution. Timing asymmetry fluctuations are thought to be due to Barkhausen-like domain-wall pinning through readback. This phenomenon is much less significant in single-crystal ferrites; hence, MIG heads are more suitable for high-density recording than polycrystalline ferrite heads
  • Keywords
    Barkhausen effect; composite materials; ferrites; magnetic domain walls; magnetic domains; magnetic heads; magnetic recording; manganese compounds; scanning electron microscope examination of materials; zinc compounds; Barkhausen-like domain-wall pinning; FeAlSi; MIG mini composite head; MnZnFeO; SPIN SEM; asymmetry fluctuations; bit shift; high-density recording; magnetic-domain observation; metal in gap miniature heads; output voltage; permeability; readback characteristics; recording characteristics; scanning electron microscopy; sharp distribution; single crystal Mn-Zn ferrite; sputtered Fe-Al-Si film; stressed ferrite; timing asymmetry; Ferrite films; Magnetic circuits; Magnetic films; Magnetic force microscopy; Magnetic heads; Magnetic recording; Permeability; Scanning electron microscopy; Timing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104742
  • Filename
    104742