DocumentCode
865872
Title
An improved thin film permanent magnet material and novel magnet design for magnetoresistive sensor biasing
Author
Smith, Neil ; Brucker, Charles F. ; Spada, Frederick E.
Author_Institution
Eastman Kodak Co., San Diego, CA, USA
Volume
26
Issue
5
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
2409
Lastpage
2411
Abstract
A high-performance CoPt thin-film permanent-magnet material and a magnet design have been developed to provide an integrated bias field source for unshielded magnetoresistive (MR) reproduce heads. A 1-μm-thick deposited permanent magnet is located above the MR element and away from the media; it is fully encapsulated and removed from the head/media interface. Problems of mutual demagnetization between magnet and media, galvanic corrosion at the exposed MR and magnet edges, and MR film degradation from an inhomogeneous adjacent permanent-magnet layer are eliminated. A CoPt magnet of specific geometry is designed to produce hard and easy axis bias fields, providing good single-domain stability while maintaining high MR sensitivity. The CoPt sputter deposition is a room-temperature process which is compatible with other temperature-sensitive head materials
Keywords
cobalt alloys; corrosion; demagnetisation; magnetic domains; magnetic heads; magnetic thin film devices; permanent magnets; platinum alloys; sputtered coatings; CoPt; film degradation; galvanic corrosion; head/media interface; improved thin film permanent magnet material; inhomogeneous adjacent permanent-magnet layer; integrated bias field source; magnetoresistive sensor biasing; mutual demagnetization; novel magnet design; room-temperature process; sensitivity; single-domain stability; sputter deposition; temperature-sensitive head materials; unshielded magnetoresistive reproduce heads; Corrosion; Degradation; Demagnetization; Galvanizing; Magnetic heads; Magnetic materials; Magnetoresistance; Nonhomogeneous media; Permanent magnets; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.104747
Filename
104747
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