DocumentCode
865880
Title
An aspect of second breakdown in transistors
Author
Agatsuma, T. ; Kohisa, T. ; Sugiyama, Akihiko
Volume
52
Issue
11
fYear
1964
Firstpage
1372
Lastpage
1373
Keywords
Breakdown voltage; Conductivity; Delay effects; Electric breakdown; Equations; Germanium alloys; P-n junctions; Sufficient conditions; Temperature sensors;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1964.3396
Filename
1445326
Link To Document