Title :
Improved bias and stability in dual-exchange-biased unshielded magnetoresistive heads
Author :
Cain, William C. ; Kryder, Mark H.
Author_Institution :
Magnetics Technol. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
9/1/1990 12:00:00 AM
Abstract :
Data are presented on dual-exchange-biased NiFe-TbCo UMR (unshielded magnetoresistive) tape heads with improved signal response and process stability. It was found that a Si3N4 passivation layer offered better stability of the exchange bias through head processing than SiO2. In order to improve sensor sensitivity, the longitudinal component of the exchange bias was reduced by increasing the exchange angle to 75° from the sense current direction. This resulted in a +6-dB improvement in signal over previous heads without sacrificing Barkhausen-noise-free operation in narrow trackwidths. Heads with trackwidths as narrow as 8 μm were shown to operate at linear densities of up to 50 kFCI with excellent signal-to-noise ratios (>45 dB). Investigations of different passivation materials showed Si3N4 to provide the best protection against environmental corrosion and thermally induced oxidation of the TbCo layer
Keywords :
cobalt alloys; iron alloys; magnetic heads; magnetic recording; magnetoresistance; nickel alloys; terbium alloys; Barkhausen-noise-free operation; NiFe-TbCo; Si3N4 passivation layer; dual-exchange-biased; environmental corrosion; head processing; process stability; sensor sensitivity; signal response; signal-to-noise ratios; thermally induced oxidation; unshielded magnetoresistive heads; Acceleration; Magnetic domains; Magnetic field measurement; Magnetic heads; Magnetic sensors; Magnetoresistance; Passivation; Pollution measurement; Protection; Stability;
Journal_Title :
Magnetics, IEEE Transactions on