DocumentCode
865941
Title
Breakdown phenomena in double–gate field–effect transistors
Author
Cobbold, Richard S. C. ; Trofimenkoff, F.N.
Volume
52
Issue
11
fYear
1964
Firstpage
1375
Lastpage
1377
Keywords
Antenna measurements; Atmospheric measurements; Electric breakdown; Frequency measurement; Millimeter wave measurements; Sun; Temperature measurement; Thermal resistance; Time measurement; Wavelength measurement;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1964.3400
Filename
1445330
Link To Document