DocumentCode :
866125
Title :
Time and Frequency Standards Based on Charged Particle Trapping
Author :
Itano, Wayne M. ; Wineland, D.J. ; Hemmati, H. ; Bergquist, J.C. ; Bollinger, J.J.
Author_Institution :
Time and Frequency Division National Bureau of Standards Boulder, Colorado 80303
Volume :
30
Issue :
2
fYear :
1983
fDate :
4/1/1983 12:00:00 AM
Firstpage :
1521
Lastpage :
1523
Abstract :
Microwave or optical frequency standards based on internal resonance transitions of ions confined in electromagnetic traps have the fundamental advantages of long observation times and small perturbations. These advantages are somewhat offset by low signal to noise ratios. Work at NBS has concentrated on microwave hyperfine transitions of atomic ions stored in Penning-type ion traps. The use of narrowband, tunable light sources for state selection and detection and for reducing the average kinetic energy of the ions (laser cooling) is an important feature of this work. Results to date include the fluorescence detection and cooling to about 50 mK of a single Mg+ ion and the observation of a 0.012 Hz linewidth on a 300 MHz 25Mg+ hyperfine transition. A frequency standard based on 201Hg+ ions is under development. Related work, mostly based on RF-type ion traps, is underway at several other labs.
Keywords :
Atom optics; Atomic beams; Charge carrier processes; Cooling; Frequency; NIST; Optical noise; Particle beam optics; Resonance; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1983.4332575
Filename :
4332575
Link To Document :
بازگشت