Title :
Signal to noise ratio of thin film disks with various orientation ratios
Author :
Mirzamaani, M. ; Re, M. ; Lambert, S.E. ; Praino, A. ; Petersen, T.S. ; Johnson, K.E.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
9/1/1990 12:00:00 AM
Abstract :
Thin-film disks with various orientation ratios (OR) ranging from 0.5 to 4.3 were fabricated by sputter deposition of CoPtCr with Cr underlayers onto preheated NiP/Al-Mg disks. The recording characteristics of these disks were investigated using a thin-film head. The isolated pulse signal amplitude-to-media noise ratio (So/N) increased when OR was increased from 0.5 to 1 and then remained relatively constant for OR⩾1. An improvement of about 10 dB in overwrite of the disks with OR>1 was observed
Keywords :
magnetic disc storage; magnetic heads; magnetic thin film devices; CoPtCr-NiP-AlMg; isolated pulse signal amplitude-to-media noise ratio; orientation ratios; overwrite; recording characteristics; sputter deposition; thin film disks; thin-film head; Chromium; Disk recording; Magnetic anisotropy; Magnetic heads; Magnetic recording; Perpendicular magnetic anisotropy; Signal to noise ratio; Sputtering; Substrates; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
