• DocumentCode
    866150
  • Title

    Review of analytical models for the study of highly doped regions of silicon devices

  • Author

    Cuevas, Andrés ; Balbuena, Miguel A.

  • Author_Institution
    Dept. of Electron. Phys., Polytech. Univ. of Madrid, Spain
  • Volume
    36
  • Issue
    3
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    553
  • Lastpage
    560
  • Abstract
    Several analytical models developed to study the transport of minority carriers in heavily doped emitter regions of silicon devices are reviewed and compared. To calculate the emitter recombination current, special emphasis is placed on the models of J. Del Alamo and R.M. Swanson (ibid, vol.31, no.12, p.1878-88, 1984) and of J.S. Park, A. Neugroschel, and F. Lindholm (ibid, vol.33, no.2, p.240-8, 1986), which are shown to contain other previous models. For solar cells and photodiodes, the quantum collection efficiency and the photogenerated current are also to be calculated; the models developed by M.A. Green and A.W. Blakers (ibid, vol.30, no.10, p.1360-5, 1983) and by J. Del Alamo and Swanson (Proc. 17th IEEE Photovoltai Specialists Conf., p.1303-8, 1984) for that purpose is described and extended. The approximate analytical solutions are shown to constitute upper and lower bounds on the exact solution. The accuracy and range of applicability of these bounds are discussed
  • Keywords
    bipolar transistors; elemental semiconductors; photodiodes; semiconductor device models; semiconductor doping; silicon; solar cells; Si devices; analytical models; approximate analytical solutions; emitter recombination current; heavily doped emitter regions; highly doped regions; lower bounds; photodiodes; photogenerated current; quantum collection efficiency; range of applicability; solar cells; transport of minority carriers; upper bounds; Analytical models; Equations; Helium; Light sources; Photodiodes; Photovoltaic cells; Radiative recombination; Silicon devices; Solar power generation; Telecommunication standards;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.19968
  • Filename
    19968