• DocumentCode
    866160
  • Title

    A nonquasi-static MOSFET model for SPICE-transient analysis

  • Author

    Park, Hong June ; Ko, Ping Keung ; Hu, Chenming

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    36
  • Issue
    3
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    561
  • Lastpage
    576
  • Abstract
    The long-channel MOSFET model is based on an approximate solution to the nonlinear current-continuity equation in the channel. The model includes the large-signal transient and the small-signal AC analyses, although only the transient model is reported here. Comparisons have been made between this model and the 1-D numerical solution to the current-continuity equation, 2-D device simulation (PISCES), and the quasistatic (QS) results. The channel-charge partitioning scheme in the charge-based QS models is shown to be inadequate for the fast transient. This model does not use a charge-partitioning scheme and the currents are dependent on the history of the terminal voltages, not just the instantaneous voltages and their derivatives. For the slow signals (compared to the channel transit time), the nonquasistatic (NQS) model is reduced to the quasistatic 40/60 channel-charge partitioning scheme. The CPU time required for this model is about two to three times longer than that of conventional MOSFET models in SPICE
  • Keywords
    insulated gate field effect transistors; semiconductor device models; 1-D numerical solution; 2-D device simulation; CPU time; PISCES; SPICE-transient analysis; channel-charge partitioning scheme; charge-based QS models; current-continuity equation; large-signal transient; long-channel MOSFET model; nonlinear current-continuity equation; nonquasistatic model; small-signal AC analyses; Capacitance; Charge carrier density; FETs; History; MOSFET circuits; Nonlinear equations; SPICE; Senior members; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.19969
  • Filename
    19969