DocumentCode :
866218
Title :
Tantalum-film technology
Author :
McLean, D.A. ; Schwartz, N. ; Tidd, E.D.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N.J.
Volume :
52
Issue :
12
fYear :
1964
Firstpage :
1450
Lastpage :
1462
Abstract :
In tantalum film circuitry, capacitors, resistors, and rudimentary interconnections are all produced in a single pattern of tantalum. Important processes are discussed in detail including 1) sputtering, by which tantalum films are produced, 2) pattern generation, and 3) anodization, by which capacitor dielectrics are formed and by which resistors are protected and adjusted to value. Predominantly the discussion is based on developments and practices of Bell Telephone Laboratories. Capacitors withstand stresses of several million volts/cm, have low leakages, a temperature coefficient of +200 to +250 ppm/°C, and a dissipation factor at 1 kc of 1 per cent maximum. Resistors of outstanding quality can be made from tantalum nitride produced by reactive sputtering. These resistors have high electrical stability and low temperature coefficients and can be fabricated to initial tolerances as low as 0.01 per cent. Because of the versatility of tantalum technology, a wide variety of circuit types can be fabricated. Tantalum technology is particularly valuable in the fabrication of thin-film integrated circuits with severe precision requirements as in the precise tuning of thin-film notch filters, and for distributed parameter networks.
Keywords :
Capacitors; Dielectrics; Integrated circuit interconnections; Integrated circuit technology; Protection; Resistors; Sputtering; Telephony; Temperature; Thin film circuits;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3429
Filename :
1445359
Link To Document :
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