• DocumentCode
    866218
  • Title

    Tantalum-film technology

  • Author

    McLean, D.A. ; Schwartz, N. ; Tidd, E.D.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, N.J.
  • Volume
    52
  • Issue
    12
  • fYear
    1964
  • Firstpage
    1450
  • Lastpage
    1462
  • Abstract
    In tantalum film circuitry, capacitors, resistors, and rudimentary interconnections are all produced in a single pattern of tantalum. Important processes are discussed in detail including 1) sputtering, by which tantalum films are produced, 2) pattern generation, and 3) anodization, by which capacitor dielectrics are formed and by which resistors are protected and adjusted to value. Predominantly the discussion is based on developments and practices of Bell Telephone Laboratories. Capacitors withstand stresses of several million volts/cm, have low leakages, a temperature coefficient of +200 to +250 ppm/°C, and a dissipation factor at 1 kc of 1 per cent maximum. Resistors of outstanding quality can be made from tantalum nitride produced by reactive sputtering. These resistors have high electrical stability and low temperature coefficients and can be fabricated to initial tolerances as low as 0.01 per cent. Because of the versatility of tantalum technology, a wide variety of circuit types can be fabricated. Tantalum technology is particularly valuable in the fabrication of thin-film integrated circuits with severe precision requirements as in the precise tuning of thin-film notch filters, and for distributed parameter networks.
  • Keywords
    Capacitors; Dielectrics; Integrated circuit interconnections; Integrated circuit technology; Protection; Resistors; Sputtering; Telephony; Temperature; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.3429
  • Filename
    1445359