• DocumentCode
    866306
  • Title

    Thin-film resistive SQUIDS

  • Author

    Krivoy, G.S. ; Koch, H.

  • Author_Institution
    Physikalisch Tech. Bundesanstalt, Berlin, Germany
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    3244
  • Lastpage
    3247
  • Abstract
    Different all thin-film partly resistive superconducting quantum interference devices (RSQUIDs) for noise thermometry in the liquid helium temperature range were designed and investigated. Three different types of RSQUID were realised: (i) dc RSQUID, (ii) rf RSQUID, and (iii) RSQUID with two quantization loops (double RSQUID). Shunted tunnel junctions were used as weak links. The resistive parts have been made as a Cu thin film combined with Nb thin films either as a sandwich or a planar element. The devices using a rf pump have integrated rf coupling coils. Resistances of the resistive parts in the range from 2.69 /spl mu//spl Omega/ to 246 /spl mu//spl Omega/ were obtained. The output signal was /spl ap/50 /spl mu/V for the dc RSQUIDs, up to 80 /spl mu/V for the rf RSQUIDs, and up to 1.2 mV for the double RSQUIDs. The linear dependences of the output signal frequency versus a dc current passed through the resistive part were observed up to 40 MHz. The double RSQUIDS described have a clear advantage in the output signal compared to the other RSQUIDs.<>
  • Keywords
    SQUIDs; superconducting device noise; 2.69 to 246 muohm; 50 muV to 1.2 mV; Cu; DC RSQUID; Nb; RF RSQUID; double RSQUID; integrated RF coupling coils; liquid helium temperature; noise thermometry; planar element; quantization loops; sandwich element; shunted tunnel junctions; superconducting quantum interference devices; thin-film resistive SQUIDS; weak link; Interference; Josephson junctions; SQUIDs; Superconducting device noise; Superconducting devices; Superconducting thin films; Temperature distribution; Thin film devices; Transistors;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.403283
  • Filename
    403283