DocumentCode :
866320
Title :
In situ measurements of the coercive force of thin film discs-a comparison of different techniques
Author :
Pressesky, J.L. ; Lee, S.Y.
Author_Institution :
Seagate Magnetics, Fremont, CA, USA
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
2472
Lastpage :
2474
Abstract :
Three critical-current detection schemes are compared for demagnetization effects: DC erase, initial pattern: 75 fc/mm: DC erase, initial pattern: 450 fc/mm; reverse DC erase (noise amplitude vs. reverse DC erase current); and amplitude saturation (isolated-pulse amplitude vs. write current). An analysis of the error between the coercivity estimated by the critical current and the coercivity as measured by a vibrating sample magnetometer allows inferences to be made concerning the effect of demagnetizing fields in each of these critical-current detection methods. In most of the cases considered, the demagnetization effects appeared to be independent of the demagnetizating ratio, and may thus be represented by a constant offset term to an otherwise linear relationship between critical current and remanent coercivity. The results obtained with regard to the DC/noise technique are somewhat contradictory with respect to results published by other investigators, but this may be due to the intrinsically low media noise of the CoCrTa media presently used
Keywords :
coercive force; demagnetisation; magnetic disc storage; magnetic thin film devices; CoCrTa; DC erase; amplitude saturation; coercive force; critical-current detection; demagnetization; low media noise; remanent coercivity; thin film discs; vibrating sample magnetometer; Coercive force; Critical current; Current measurement; Demagnetization; Error analysis; Force measurement; Magnetic analysis; Magnetic field measurement; Noise level; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104768
Filename :
104768
Link To Document :
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