• DocumentCode
    866406
  • Title

    Test sets and reject rates: all fault coverages are not created equal

  • Author

    Maxwell, Peter C. ; Aitken, Robert C.

  • Author_Institution
    Hewlett-Packard Co., Santa Clara, CA, USA
  • Volume
    10
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    51
  • Abstract
    The use of stuck-at-fault coverage for estimating overall quality levels is examined. Data from a part tested with both functional and scan tests are analyzed and compared with quality predictions generated by three existing theoretical models. It is shown that reasonable predictions are possible for functional tests, but that scan tests, due to misuse of theoretical equations, produce significantly worse quality levels than predicted.<>
  • Keywords
    fault location; logic testing; fault coverages; functional tests; quality levels; reject rates; scan tests; stuck-at-fault coverage; test sets; Circuit faults; Circuit testing; Clocks; Design engineering; Digital integrated circuits; Economic forecasting; Flip-flops; Integrated circuit testing; Manufacturing; Production;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.199804
  • Filename
    199804
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=866406