Title :
Test sets and reject rates: all fault coverages are not created equal
Author :
Maxwell, Peter C. ; Aitken, Robert C.
Author_Institution :
Hewlett-Packard Co., Santa Clara, CA, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
The use of stuck-at-fault coverage for estimating overall quality levels is examined. Data from a part tested with both functional and scan tests are analyzed and compared with quality predictions generated by three existing theoretical models. It is shown that reasonable predictions are possible for functional tests, but that scan tests, due to misuse of theoretical equations, produce significantly worse quality levels than predicted.<>
Keywords :
fault location; logic testing; fault coverages; functional tests; quality levels; reject rates; scan tests; stuck-at-fault coverage; test sets; Circuit faults; Circuit testing; Clocks; Design engineering; Digital integrated circuits; Economic forecasting; Flip-flops; Integrated circuit testing; Manufacturing; Production;
Journal_Title :
Design & Test of Computers, IEEE
