DocumentCode
866416
Title
Fault isolation in an integrated diagnostic environment
Author
Simpson, William R. ; Sheppard, John W.
Author_Institution
Arinc Research Corp., Annapolis, MD, USA
Volume
10
Issue
1
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
52
Lastpage
66
Abstract
The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.<>
Keywords
automatic testing; boundary scan testing; fault location; failure frequency; fault isolation; information flow models; integrated diagnostic environment; multiple cost criteria; objective cost function; optimizing diagnosis; skill level; test time; Circuit faults; Circuit testing; Data analysis; Design engineering; Failure analysis; Fault detection; Fault diagnosis; Information resources; Manuals; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.199805
Filename
199805
Link To Document