Title :
Fault isolation in an integrated diagnostic environment
Author :
Simpson, William R. ; Sheppard, John W.
Author_Institution :
Arinc Research Corp., Annapolis, MD, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.<>
Keywords :
automatic testing; boundary scan testing; fault location; failure frequency; fault isolation; information flow models; integrated diagnostic environment; multiple cost criteria; objective cost function; optimizing diagnosis; skill level; test time; Circuit faults; Circuit testing; Data analysis; Design engineering; Failure analysis; Fault detection; Fault diagnosis; Information resources; Manuals; System testing;
Journal_Title :
Design & Test of Computers, IEEE
