• DocumentCode
    866483
  • Title

    Integrated complementary transistor nanosecond logic

  • Author

    Seeds, R.B. ; Smith, W.R. ; Nevala, R.D.

  • Author_Institution
    Fairchild Camera and Instruments Corp., Palo Alto, Calif.
  • Volume
    52
  • Issue
    12
  • fYear
    1964
  • Firstpage
    1584
  • Lastpage
    1590
  • Abstract
    An integrated complementary transistor circuit family particularly suited to high-speed system applications is described. Delays per logic decision ranging from three to six nanoseconds are common with associated rise times ranging from 5 to 15 nsec. This has been accomplished by designing the circuits in conjunction with system interconnection considerations. The basic circuit types are p-n-p--n-p-n AND-OR gate and a compatible NOR-OR gate. The AND-OR gate is comparable to a diode AND-OR gate but with current gain added, thus improving the fan-in and fan-out characteristics. The faster functional operation with slower rise times is based on minimum delay through the emitter follower type AND-OR gate. The resulting wired-OR function allows additional logical flexibility. Typically, three or four levels of AND-OR circuitry may be used before the voltage levels need be restored. The NOR-OR element completes the basic logic complement, establishes the basic rise time of the circuits, restores the voltage levels, and provides noise rejection. The rise time is selected to allow open wire signal lines for all but the longest interconnections. The static and dynamic characteristics of these circuits are presented in detail. Effects of capacitive loading, fan-out, and isolation capacitance are described. Noise rejection is discussed along with various modes of noise generation. Functional performance of the circuit family is demonstrated with two subsystem functions. A fifty-gate fast-carry pyramid was constructed using open transmission lines to study small function operations. Noise and delay characteristics are given. Register-to-register communication over a five-register bus was demonstrated with a 150-gate model.
  • Keywords
    Circuit noise; Delay; Diodes; Integrated circuit interconnections; Logic circuits; Noise generators; Noise level; Signal restoration; Voltage; Wire;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.3449
  • Filename
    1445379