DocumentCode
866515
Title
Improving defect detection in static-voltage testing
Author
Renovell, Michel ; Azaïs, Florence ; Bertrand, Yves
Author_Institution
Microelectron. Dept., Lab. d´´Informatique Robotique Microelectronique de Montpellier, France
Volume
19
Issue
6
fYear
2002
Firstpage
83
Lastpage
89
Abstract
Analyzing defect behavior is becoming increasingly difficult with the rising significance of defects that depend on random parameters. Such unpredictable parameters can affect various types of test escape. The concept of detection domains can help sort out the behavior of these test escapes.
Keywords
automatic testing; electronic equipment testing; logic testing; production testing; circuit outputs; defect behavior; defect detection; detection domains; manufactured unit; manufacturing technology; random parameters; static-voltage testing; test escape; test process; test vectors; Boolean functions; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Propagation delay; Terminology; Threshold voltage;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2002.1047747
Filename
1047747
Link To Document