Title :
Transient simulation of lossy interconnects based on the recursive convolution formulation
Author :
Lin, Shen ; Kuh, Ernest S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fDate :
11/1/1992 12:00:00 AM
Abstract :
An approach for transient simulation of lossy interconnects terminated in arbitrary nonlinear elements based on convolution simulation is presented. The Pade approximations of each line´s characteristics or each multiconductor line´s modal functions are used to derive a recursive convolution formulation, which greatly reduces the amount of computation used to perform convolutions. The approach can handle frequency-varying effects, such as skin effects, and general coupling situations. The errors introduced by Pade approximations are analyzed, and a scheme for determining the necessary order for an approximation is developed. The approach has been incorporated in the stepwise equivalent conductance timing simulator (SWEC) for digital CMOS circuits. Comparisons with SPICE3.e indicate that SWEC, which gives accurate results, can be one to two orders of magnitude faster
Keywords :
circuit analysis computing; digital simulation; distributed parameter networks; error analysis; packaging; transient response; transmission line theory; Pade approximations; SWEC; digital CMOS circuits; errors; frequency-varying effects; lossy coupled lines; lossy interconnects; modal functions; recursive convolution formulation; skin effects; stepwise equivalent conductance timing simulator; transient simulation; Circuit simulation; Computational modeling; Convolution; Delay estimation; Dielectric losses; Distributed parameter circuits; Integrated circuit interconnections; Power system transients; Propagation losses; Transmission line theory;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on