DocumentCode
866883
Title
Metastability of CMOS master/slave flip-flops
Author
Gabara, Thaddeus J. ; Cyr, Gregory J. ; Stroud, Charles E.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
Volume
39
Issue
10
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
734
Lastpage
740
Abstract
Presents circuit techniques to improve the mean time between failures (MTBF) of a latch due to metastable events. The complete approach includes a unique design of the latch and the formation of series connected master/slave (M/S) flip-flops using this latch. An equation is developed to predict the MTBF due to metastability of a single latch and is extended to include single and multiple series connected M/S flip-flops. The equation predicts that the MTBF increases significantly by using such a M/S flip-flop configuration
Keywords
CMOS integrated circuits; circuit reliability; flip-flops; integrated logic circuits; sequential circuits; CMOS master/slave flip-flops; MTBF; circuit techniques; mean time between failures; metastability; metastable events; series-connected flip-flops; single latch; Apertures; Circuits; Clocks; Equations; Flip-flops; Frequency; Latches; Logic; Master-slave; Metastasis;
fLanguage
English
Journal_Title
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7130
Type
jour
DOI
10.1109/82.199899
Filename
199899
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