Title :
Metastability of CMOS master/slave flip-flops
Author :
Gabara, Thaddeus J. ; Cyr, Gregory J. ; Stroud, Charles E.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fDate :
10/1/1992 12:00:00 AM
Abstract :
Presents circuit techniques to improve the mean time between failures (MTBF) of a latch due to metastable events. The complete approach includes a unique design of the latch and the formation of series connected master/slave (M/S) flip-flops using this latch. An equation is developed to predict the MTBF due to metastability of a single latch and is extended to include single and multiple series connected M/S flip-flops. The equation predicts that the MTBF increases significantly by using such a M/S flip-flop configuration
Keywords :
CMOS integrated circuits; circuit reliability; flip-flops; integrated logic circuits; sequential circuits; CMOS master/slave flip-flops; MTBF; circuit techniques; mean time between failures; metastability; metastable events; series-connected flip-flops; single latch; Apertures; Circuits; Clocks; Equations; Flip-flops; Frequency; Latches; Logic; Master-slave; Metastasis;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
