Spurious signals in digital CMOS VLSI circuits: a propagation analysis

Author

Moll, Francesc ; Rubio, Antonio

Author_Institution

Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain

Volume

39

Issue

10

fYear

1992

fDate

10/1/1992 12:00:00 AM

Firstpage

749

Lastpage

752

Abstract

Spurious signals may appear as a result of a variety of causes, such as hazards, crosstalk, and others. These signals may produce transient or even permanent logic errors in digital circuits if they affect memory elements. This work deals with the analysis of the penetration capability and the calculation of the propagation depth of such signals through logic circuits. The results are useful to determine the domain of effect of spurious signals and to point out rules for its detection

Keywords

CMOS integrated circuits; VLSI; crosstalk; integrated logic circuits; crosstalk; digital CMOS VLSI circuits; hazards; logic circuits; memory elements; penetration capability; permanent logic errors; propagation analysis; propagation depth; spurious signals; Acoustic signal processing; Adaptive signal processing; CMOS digital integrated circuits; Circuit analysis; Least squares approximation; Signal analysis; Signal processing; Signal processing algorithms; Speech processing; Very large scale integration;

fLanguage

English

Journal_Title

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7130

Type

jour

DOI

10.1109/82.199902

Filename

199902