DocumentCode :
867054
Title :
Production of p¿n junctions with bulk controlled characteristics
Author :
Maddex, K.A. ; Young, M.R.P.
Author_Institution :
Texas Instruments Ltd., Bedford, UK
Volume :
1
Issue :
7
fYear :
1965
fDate :
9/1/1965 12:00:00 AM
Firstpage :
191
Lastpage :
192
Abstract :
Two methods of eliminating surface effects so that microplasma breakdown of p¿n junctions can be observed are described, and their limitations are discussed. The first, applicable to diffused junctions, increases the space-charge-layer width, while the second reduces the applied voltage at the periphery of alloyed structures.
Keywords :
electric breakdown; plasma; semiconductor junctions;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19650176
Filename :
4205718
Link To Document :
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