• DocumentCode
    867108
  • Title

    Intrinsic Josephson junctions in high-T/sub c/ superconductors as high frequency sources

  • Author

    Schlenga, K. ; Hechtfischer, G. ; Walkenhorst, W. ; Muller, P. ; Regi, F.X. ; Savary, H. ; Schneck, J. ; Veith, M. ; Brodkorb, W. ; Steinbeiss, E.

  • Author_Institution
    Walther-Meissner-Inst. fur Tieftemperaturforschung, Garching, Germany
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    3272
  • Lastpage
    3275
  • Abstract
    We report on microwave emission experiments of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+y/-single crystals at frequencies between 12 GHz and 95 GHz. Due to the intrinsic Josephson effect these samples form series connections of typically 2000 contacts. For the first time we observed phase-locking of more than 1000 junctions at 93.7 GHz in Bi/sub 1.8/Pb/sub 0.2/Sr/sub 2/CaCu/sub 2/O/sub 8+y/ single crystals. Concerning the development of high frequency sources we report on first experiments on vertically structured thin films of Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10/.<>
  • Keywords
    Josephson effect; barium compounds; bismuth compounds; calcium compounds; high-temperature superconductors; microwave generation; strontium compounds; superconducting microwave devices; thallium compounds; 12 to 95 GHz; Bi/sub 1.8/Pb/sub 0.2/Sr/sub 2/CaCu/sub 2/O/sub 8+y/; Bi/sub 1.8/Pb/sub 0.2/Sr/sub 2/CaCu/sub 2/O/sub 8/; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+y/ single crystals; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/; Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10/; high frequency sources; high-T/sub c/ superconductors; intrinsic Josephson junctions; microwave emission; phase locking; series connections; vertically structured thin films; Bandwidth; Bismuth compounds; Crystals; Frequency; Impedance matching; Josephson junctions; Oscillators; Superconductivity; Thin film circuits; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.403290
  • Filename
    403290