• DocumentCode
    867117
  • Title

    Design and Performance of Two 1k CMOS/SOS Hardened RAMs

  • Author

    Brucker, G.J. ; Caracciolo, G.T. ; Gehweiler, W.F. ; Heagerty, W.F.

  • Author_Institution
    RCA Advanced Technology Laboratories Government Systems Division Camden, New Jersey 08102
  • Volume
    30
  • Issue
    3
  • fYear
    1983
  • fDate
    6/1/1983 12:00:00 AM
  • Firstpage
    1920
  • Lastpage
    1925
  • Abstract
    RCA is under contract to DoD to develop two 5V 1K CMOS/SOS RAMs capable of meeting stringent total dose and transient radiation levels. This paper presents the design, operation, characterization, and test results of the RAMs´ capabilities to meet these radiation levels. The radiation resistance of these circuits is enhanced through design by dominant PMOS utilization, the exclusion of source followers, and tolerance to large threshold voltage shifts. Test results on further enhancement through radiation hardened processing are presented. This effort demonstrates a factor of 5 to 10 improvement in circuit radiation hardness by consideration of technology radiation characteristics in the design phase. Hardened processing can extend the performance of these parts to total dose environments in excess of 500K rads making them useful in extended space missions and severe military environments.
  • Keywords
    CMOS technology; Circuit testing; Contracts; Latches; MOS devices; Phased arrays; Radiation hardening; Random access memory; Read-write memory; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4332673
  • Filename
    4332673