DocumentCode :
867363
Title :
Performances of a Capacitorless 1T-DRAM Using Polycrystalline Silicon Thin-Film Transistors With Trenched Body
Author :
Lin, Jyi-Tsong ; Huang, Kuo-Dong ; Jheng, Bao-Tang
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
Volume :
29
Issue :
11
fYear :
2008
Firstpage :
1222
Lastpage :
1225
Abstract :
Polycrystalline silicon thin-film transistors (TFTs) can be improved by integrating DRAM on chip. However, the TFT´s poor capacitance means that traditional DRAMs are infeasible, because they require a capacitor. An alternative, the one-transistor DRAM (1T-DRAM), is promising because it avoids the capacitor by instead storing the logical value as holes trapped in the body region. This letter proposes the use of a trenched body in a TFT to construct a 1T-DRAM. Previously, we have shown that a trenched body reduces the leakage current of a TFT. In this letter, we now show that the trenched-body TFT also works well as a 1T-DRAM device. It has a strong back-gating effect and a programming window that is more than twice as large as that of the conventional TFT.
Keywords :
DRAM chips; elemental semiconductors; leakage currents; semiconductor thin films; silicon; thin film transistors; 1T-DRAM chip; Si; TFT; back gating effect; leakage current; one-transistor DRAM; polycrystalline silicon thin film transistor; programming window; trenched body; Floating-body cell (FBC); one-transistor DRAM (1T-DRAM); polycrystalline silicon thin-film transistor (TFT); programming window;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2008.2004632
Filename :
4627438
Link To Document :
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