Thickness and roughness dependence of DC modulation noise in thin film magnetic recording disk media

Author

Katti, R.R. ; Saunders, D.A.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

2712

Lastpage

2714

Abstract

DC modulation noise was studied as a function of magnetic-layer thickness and surface roughness for longitudinal, low-noise, nominally 1000-Oe, plated CoP and CoNiZnP, thin-film magnetic recording disk media made from controlled fabrication runs. DC modulation noise is generated when a reverse longitudinal DC field is applied to a uniformly magnetized disk. A model which allows autocorrelation functions and noise spectra to be calculated and which agrees with measured noise data (with correlations greater than 0.99) was developed. Trends observed with measured data and the model indicate that inhomogeneities in the medium, and not surface roughness, are the dominant sources of noise

Keywords

cobalt alloys; magnetic recording; magnetic thin films; metallic thin films; nickel alloys; noise; phosphorus alloys; zinc alloys; CoNiZnP; CoP; DC modulation noise; autocorrelation functions; magnetic-layer thickness; noise spectra; roughness dependence; surface roughness; thin film magnetic recording disk media; Fabrication; Magnetic field measurement; Magnetic films; Magnetic modulators; Magnetic noise; Magnetic recording; Noise measurement; Rough surfaces; Surface roughness; Thickness control;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104847

Filename

104847