DocumentCode :
867522
Title :
A partial variational approach for arbitrary discontinuities in planar dielectric waveguides
Author :
Chung, Shyh-Jong ; Chen, Chun Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
37
Issue :
1
fYear :
1989
fDate :
1/1/1989 12:00:00 AM
Firstpage :
208
Lastpage :
214
Abstract :
A novel approach for analyzing arbitrary discontinuities in planar dielectric waveguides is proposed that uses the finite-element method along with the frontal solution technique. On the basis of the partial variational principle (PVP), the fields interior and exterior to the discontinuity finite-element region can be treated independently and eventually can be coupled. The interior fields are expanded by the finite-element nodal values and the corresponding local bases, while the exterior ones are handled by an approach combining modal expansion and Green´s function. In numerical computation, the continuous spectra of the waveguide modes are discretized by the Laguerre expansion method. To check the correctness of the present analysis, two numerical results are compared to those of other methods. The scattering characteristics of several linearly tapered discontinuities, such as transformers and feed structures, are analyzed and compared to those having step junctions
Keywords :
Green´s function methods; dielectric waveguides; finite element analysis; variational techniques; waveguide theory; Green´s function; Laguerre expansion method; arbitrary discontinuities; exterior fields; feed structures; finite-element method; frontal solution technique; interior fields; linearly tapered discontinuities; modal expansion; partial variational principle; planar dielectric waveguides; scattering characteristics; step junctions; transformers; Dielectrics; Feeds; Finite element methods; Optical scattering; Optical waveguides; Planar waveguides; Slabs; Transformers; Waveguide components; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.20040
Filename :
20040
Link To Document :
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