DocumentCode :
867534
Title :
Determination of thin film media model parameters using DPC imaging and torque measurements
Author :
Beardsley, Irene A. ; Speriosu, V.S.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
2718
Lastpage :
2720
Abstract :
A micromagnetic model consisting of coupled hexagonal grains has been used to investigate the remanent-state ripple structure, the expected torque, and the rotational hysteresis behavior of thin magnetic films. The parameters of the model are the anisotropy field, the magnetostatic coupling, and the phenomenological exchange coupling between grains. The scale of the ripple pattern as measured by Lorentz microscopy using the differential phase contrast imaging technique can be used to fix the model parameters unambiguously, under the assumption that the parameters have fixed single values. Experimental rotational hysteresis curves cannot by fitted in detail without assuming a fairly broad distribution of anisotropy fields. It should be possible, given both kinds of data on a single sample, to determine the exchange coupling and average anisotropy field as well as a distribution of anisotropy fields which fits the width of the rotational hysteresis curve
Keywords :
magnetic anisotropy; magnetic recording; magnetic thin films; DPC imaging; Lorentz microscopy; anisotropy field; broad distribution; coupled hexagonal grains; differential phase contrast imaging technique; expected torque; magnetostatic coupling; micromagnetic model; phenomenological exchange coupling; remanent-state ripple structure; rotational hysteresis; thin film media model parameters; thin magnetic films; torque measurements; Anisotropic magnetoresistance; Couplings; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Magnetostatics; Micromagnetics; Perpendicular magnetic anisotropy; Torque; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104849
Filename :
104849
Link To Document :
بازگشت