DocumentCode
867805
Title
FPGA Based System for Open, Short, and RC Impedance Measurement
Author
Newman, Kimberly E.
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of Denver, Denver, CO, USA
Volume
33
Issue
1
fYear
2010
Firstpage
147
Lastpage
152
Abstract
This paper describes a time-based digital test system that may be used to detect opens, and shorts, as well as measure resistive and capacitive impedance of interconnect networks. The specific test implementation is customized through a field programmable gate array (FPGA). The use of an FPGA allows for reconfiguration of the test for many different interconnect verifications. The current progress of this system is demonstrated and experimental measurements are provided.
Keywords
RC circuits; electric resistance measurement; field programmable gate arrays; integrated circuit interconnections; logic testing; FPGA; RC impedance measurement; capacitive impedance measurement; field programmable gate array; interconnect networks; interconnect verification; resistive impedance measurement; time-based digital test system; Embedded passives; interconnect test; reconfigurable system;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2009.2018463
Filename
4926134
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