Title :
FPGA Based System for Open, Short, and RC Impedance Measurement
Author :
Newman, Kimberly E.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Denver, Denver, CO, USA
Abstract :
This paper describes a time-based digital test system that may be used to detect opens, and shorts, as well as measure resistive and capacitive impedance of interconnect networks. The specific test implementation is customized through a field programmable gate array (FPGA). The use of an FPGA allows for reconfiguration of the test for many different interconnect verifications. The current progress of this system is demonstrated and experimental measurements are provided.
Keywords :
RC circuits; electric resistance measurement; field programmable gate arrays; integrated circuit interconnections; logic testing; FPGA; RC impedance measurement; capacitive impedance measurement; field programmable gate array; interconnect networks; interconnect verification; resistive impedance measurement; time-based digital test system; Embedded passives; interconnect test; reconfigurable system;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2009.2018463
